Failures in electronic devices caused by radiation is one of the most challenging is-sues arising in the last decades. Nowadays, the radiation effects are crucial not only in the space environment, but also at the sea level, since transistor downscaling is affecting the characteristics of the integrated circuits. When operating in hostile environments, solid-state devices and integrated circuits may be directly struck by photons, electrons, protons, neutrons, heavy ions, or alpha particles causing alteration of their electrical properties. This puts at risk the reliability and integrity of thosedevices, leading also to possible catastrophic consequences if they occur in safety critical applications.