Design of a clock diagnostic module for Built-In Self-Test of System on Chip
Anna Ferrara
Design of a clock diagnostic module for Built-In Self-Test of System on Chip.
Rel. Guido Masera. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Elettronica (Electronic Engineering), 2018
Abstract
Design of test chip for SoC's electrical measurements using BIST (Built-In Self Test) mechanism, test bench developing, design simulation, synthesis, constraints definitions
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