In recent times, automotive systems, and in general all the safety-critical fields, are increasingly entrusting micro-controllers to perform complex and delicate tasks, also concerning safety-related functions. This extensive use of processors has consequently led to the need to make them more reliable and robust against errors that may lead to the violation of a safety goal, avoiding any unreasonable risk. For what concerns the systematic errors, they can be addressed and avoided at the design stage, paying particular attention to the item testing. On the other hand, Random Hardware Failures (RHFs) cannot be avoided nor predicted deterministically. The main causes behind Random Hardware Failures can be attributed to corrosion, thermal stressing, wear- out, radiations, and manufacturing defects.