Davide Pecchio
Electrical Characterization of Hex-SiGe Nanowires.
Rel. Matteo Cocuzza. Politecnico di Torino, Corso di laurea magistrale in Nanotechnologies For Icts (Nanotecnologie Per Le Ict), 2021
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Abstract
The semiconductor industry has required a significant increase in energy efficiency and computational performance of the electronic devices for decades. This results in the search for low-power, high-frequency devices. To meet these demands it was necessary to replace the electrical signals with photonic signals. One of the possible candidates are group III-V semiconductor materials, which can efficiently emit light, but they are not CMOS compatible, so their integration with Si chips is very expensive. Ge-rich SiGe alloys grown in the hexagonal crystal structure showed a direct bandgap nature. SiGe compounds are epitaxially grown in the hexagonal phase by MOVPE on thin hexagonal GaAs nanowires, that act as templates.
The result is a hex-GaAs core surrounded by a hex-SiGe shell in a GaAs/SiGe core/shell nanowire configuration
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