The downscaling of electronic components in terms of voltage and physical dimensions has enabled the development of modern high-performance microprocessors, which are increasingly adopted in safety-critical applications. However, their reduced dimensions have increased the sensitivity to radiation. Radiation-induced soft errors have become a key threat in terms of reliability in safety-critical real-time embedded systems (SACRES). A common technique used to enhance the hardware reliability is N-Modular Redundancy (NMR). With the growing complexity of modern microprocessors, this solution has become unaffordable. The development of lighter alternatives for implementing hardware/software error detection mechanisms has become a crucial area of research. This thesis investigates the effects of fault injections on automotive benchmarks to assess the reliability of the target setup, a crucial step for studying new, lighter robustness solutions.