Livello precedente |
Elhadji Alhousseyni Diallo. Caractérisation électrique et fiabilité de la prochaine génération de transistors FDSOI = Electrical characterization and Reliability of next generation of FDSOI transistors. Rel. Carlo Ricciardi. Politecnico di Torino, Corso di laurea magistrale in Nanotechnologies For Icts (Nanotecnologie Per Le Ict), 2024