The modern automotive industry makes great use of System-on-Chips (SoCs) in their products. One very relevant component present inside of the SoCs is the integrated random access memory. These memories are characterized by a probability of failure graph, which can be expressed using the Bathtub Curve. After the “packaging” of the SoC is carried out a process called “burn-in” is performed. This procedure consists of a certain number of reading and writing cycles on the memory, these cycles are repeated for a sufficient amount of time to bring the memories out of the “Infant Mortality” region. At the end of this process the SoCs that present some failures inside their memories, can either be repaired or either be discarded.