As the complexity and size of modern electronic devices increase, it becomes increasingly difficult to fully cover the different types of defects that can occur. In particular, with new technologies, intra-cell defects have become vital. For this reason, cell-aware testing has recently been added to traditional processes to achieve desired levels of quality. This thesis proposes new methodologies to optimize cell-aware testing in two different but equally significant contexts in the modern approach to testing both safety-critical and non-safety-critical devices. The first context analyzed is Cell-Aware Stress Testing. This testing method is becoming increasingly important to excite potential latent defects that may occur inside the device cells.