Gate-All-Around FET: analytical compact modeling and TCAD validation for system performance evaluation
Silvio Gucciardo
Gate-All-Around FET: analytical compact modeling and TCAD validation for system performance evaluation.
Rel. Marco Vacca, Fabrizio Mo. Politecnico di Torino, Corso di laurea magistrale in Nanotechnologies For Icts (Nanotecnologie Per Le Ict), 2023
