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Gate-All-Around FET: analytical compact modeling and TCAD validation for system performance evaluation

Silvio Gucciardo

Gate-All-Around FET: analytical compact modeling and TCAD validation for system performance evaluation.

Rel. Marco Vacca, Fabrizio Mo. Politecnico di Torino, Corso di laurea magistrale in Nanotechnologies For Icts (Nanotecnologie Per Le Ict), 2023