In Infineon Technologies Austria AG (IFAT), a crucial phase during the Integrated Circuit (IC) design process, consists in execute life tests and stress tests within the quality lab. In order to analyze the reliability of these devices, specific tests are used to simulate accelerated lifetime and worst case conditions. This process is both exploited during the design of new devices and during the qualification before the market release. As a part of Infineon Kompetenzzentrum Automobil- und Industrie-Elektronik (KAI) is involved in developing advanced stress test systems which can perform a wide range of tests. The main advantage of these test systems is their modularity, which allows to use the same hardware for testing a wide range of devices by just changing the board where the Device Under Test (DUT) is placed.