At CERN, many electronic systems need to operate in a radiation environment along with the Large Hadron Collider (LHC). Thus, the Radiation Hardness Assurance (RHA) of electronic components is fundamental to ensure the reliable functioning of accelerators and experiments. Because of their benefits in terms of costs, flexibility, and performances, Field Programmable Gate Arrays (FPGAs) are often the core of several electronic systems. However, their lifetime and performances are affected by radiation-induced effects such as Single-Event Effects (SEE) and Total Ionizing Dose (TID). This creates the necessity to perform many qualification tests to find a suitable FPGA to use in a specific system or experiment.