Lavinia Degli Abbati
Power consumption measurements during NVM tests and solutions for low power embedded test code development.
Rel. Paolo Bernardi. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Elettronica (Electronic Engineering), 2020
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Abstract
Every electronic device needs to be tested few and few times before going into the market to assure that it works as expected and it is safe. Testing is a procedure done between every step of the circuit production, from wafer level to the step just before selling the integrated circuit into the market, because first the DUT is tested and more money we can save if it is faulty. There are uncountable parts of a DUT that must be tested and the ones that are analyzed in this work are the flash memories embedded in it. Test the memories is crucial because they are the denser part in an electronic circuit and so the probability of a fault to occur is very high.
There are different techniques implemented for testing memories and the most popular one is the Memory Built-In Self Test (MBIST) which consists in designing additional hardware and software features into integrated circuits to allow them to perform self-testing
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