Giorgio Arcuri
Automatic Test Equipment structure mass reduction by means of topology optimization process.
Rel. Giorgio Chiandussi, Andrea Tridello. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Meccanica (Mechanical Engineering), 2019
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Abstract
Nowadays, electronics surrounds every aspect of our life and almost every device has got an electronic board installed. From vehicles to smartphones, from tablets to the most complex aerospace, medical and military devices, this is a world guided by the continuous discovery of new technologies, which implies a continuous evolution of the systems utilized for the automatic testing of semiconductors, MEMS and electronic boards. In engineering practice is often highlighted the need to decrease the mass of a structure, preserving an adequate stiffness and resistance. One of the simplest and traditional solutions would be the choice of a different material, lighter, and at the same time, with higher mechanical properties with respect to the one previously used.
However, this solution is often related to an increase in the cost of the material, which make this option not always viable
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