In the context of modern automotive systems, the increasing complexity and integration of electronic components have made reliability and safety critical design concerns. Among the most insidious threats to system integrity are bit flips, unintended changes in the state of a memory bit, caused by phenomena such as cosmic radiation, electromagnetic interference, or manufacturing defects. These transient faults, though seemingly minor, can lead to catastrophic consequences in safety-critical applications, including unintended behavior of control systems, data corruption, or even complete system failure. Real-world incidents, such as unexpected airbag deployments or engine control malfunctions, have been traced back to such low-level hardware faults, underscoring the urgent need for robust error resilience strategies.