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Characterization and Correction of Optical Aberrations in MINFLUX Superresolution Microscopy

Francisco Gilberto Matos Alvarez

Characterization and Correction of Optical Aberrations in MINFLUX Superresolution Microscopy.

Rel. Carlo Ricciardi. Politecnico di Torino, Corso di laurea magistrale in Nanotechnologies For Icts (Nanotecnologie Per Le Ict), 2023

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Abstract:
Relators: Carlo Ricciardi
Academic year: 2023/24
Publication type: Electronic
Number of Pages: 60
Subjects:
Corso di laurea: Corso di laurea magistrale in Nanotechnologies For Icts (Nanotecnologie Per Le Ict)
Classe di laurea: New organization > Master science > LM-29 - ELECTRONIC ENGINEERING
Aziende collaboratrici: Research Institute of Molecular Pathology GmbH
URI: http://webthesis.biblio.polito.it/id/eprint/28999
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