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C-model based verification of a generic IP: an automatic UVM based approach for the functional verification of RTL designs through correspondence checking with a reference C??model.

Andrea Amato

C-model based verification of a generic IP: an automatic UVM based approach for the functional verification of RTL designs through correspondence checking with a reference C??model.

Rel. Maurizio Martina. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Elettronica (Electronic Engineering), 2023

Abstract:

Universal Verification Methodology (UVM) is a standardized methodology for verifying complex integrated circuit designs in the semiconductor industry. For the verification of some IPs it may be convenient to use a golden model, which generates the ideal expected outputs which are compared in scoreboard with the actual outputs of the design under test (DUT). Golden models are mostly written in C or C++ to reproduce the correct functionality of the DUT. IP verification with the help of high-level models is a frequent practice, because of its ease of implementation and speed of simulation as compared to doing the same at a lower level of abstraction (RTL). In the current thesis is proposed an approach to efficiently verify the lower level RTL and determine its correspondence with the C model. The goal of this work is to develop a partially reusable verification environment with the aim of automating the capture of actual outputs and their comparison with the expected outputs generated by a C model, allowing a rapid adoption of a golden reference model in the IP verification flow.

Relators: Maurizio Martina
Academic year: 2023/24
Publication type: Electronic
Number of Pages: 84
Additional Information: Tesi secretata. Fulltext non presente
Subjects:
Corso di laurea: Corso di laurea magistrale in Ingegneria Elettronica (Electronic Engineering)
Classe di laurea: New organization > Master science > LM-29 - ELECTRONIC ENGINEERING
Aziende collaboratrici: STMicroelectronics
URI: http://webthesis.biblio.polito.it/id/eprint/28518
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