Generation and evaluation of software programs for delay testing of microprocessors Nowadays, the electronic devices have invaded lots of different fields becoming very important for most of the objects that are used every days. The quality of these electronic devices is directly connected to their dependability, moreover the semiconductor industries are constantly looking for new technologies that allow big improvements in terms of performance. in the last few years, the channel length of a transistor is set to few tens of nanometers, this is the principal cause of the increasing complexity in manufacturing processes, but it allows very high working frequency and dense designs, leading also more frequent physical defects and devices die in less time.