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RELIABILITY ISSUES AMONG ANDROID COMPONENTS: ANALYSIS, TESTING AND SOLUTIONS

Vincenzo Chiaramida

RELIABILITY ISSUES AMONG ANDROID COMPONENTS: ANALYSIS, TESTING AND SOLUTIONS.

Rel. Antonio Lioy, Ugo Buy. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Informatica (Computer Engineering), 2018

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Abstract:

Sicurezza nel Sistema Operativo Android per dispositivi mobile

Relators: Antonio Lioy, Ugo Buy
Academic year: 2017/18
Publication type: Electronic
Number of Pages: 77
Subjects:
Corso di laurea: Corso di laurea magistrale in Ingegneria Informatica (Computer Engineering)
Classe di laurea: New organization > Master science > LM-32 - COMPUTER SYSTEMS ENGINEERING
Ente in cotutela: UNIVERSITY OF ILLINOIS AT CHICAGO (STATI UNITI D'AMERICA)
Aziende collaboratrici: UNSPECIFIED
URI: http://webthesis.biblio.polito.it/id/eprint/8241
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