Test access to internal device resources is a fundamental requirement in industrial embedded systems. A flexible and programmable FPGA-based platform can serve as a compact and customizable test controller, representing a building block toward ATE-oriented solutions while integrating into existing proprietary software environments. This thesis focuses on a protocol-aware, minimal pinout FPGA-based test controller for the TC48x microcontroller (Infineon Technologies). The work is structured in two main phases. In the first phase, an existing FPGA-based JTAG access controller was integrated into a proprietary industrial software framework, enabling memory access to the target device. In the second phase, a proprietary two-wire access protocol was studied and implemented on an FPGA.