This thesis work is based on conducting experimental activities to measure the resonance frequency and the quality factor of different cantilevers used in Atomic Force Microscopy (AFM), using the micro Laser Doppler Vibrometer and the Scanning Electron Microscope (SEM) available at INRiM. The aim of this thesis is therefore to investigate the experimental parameters involved in the use of Sader's formula to calculate the spring constant of cantilevers in AFM, together with a detailed uncertainty analysis. Although a procedure exists to ensure metrological traceability to SI units for nanoscale displacements in the horizontal X and Y axes and in the vertical Z axis, a method to ensure traceability for nanoscale forces has not yet been developed.