Francesco Mistretta
Test optimization for DC/DC converters.
Rel. Matteo Sonza Reorda. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Elettronica (Electronic Engineering), 2024
Abstract
Semiconductor production is a highly optimized, accurate and standardized process with extremely high yields, however, it is not perfect. Defective or non-compliant devices need to be identified and isolated to avoid putting on the market non-working products. Testing of all the devices is performed by dedicated Automatic Test Equipment (ATE), which are specialized machines able to perform very fast measurements with high parallelism, being capable of measuring the parameters of many devices at the same time. These machines offer the hardware resources to perform the test, but this must be first written by a Test Engineer. Each product can be vastly different from the others, and every test program is often written from scratch to suit the specific device that needs to be tested.
The process of writing and debugging the test program, together with the full verification of the semiconductor design, often takes years and is a major cost item in the development of each new design
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