Jose Huertas Pedroche
Position information enhancing by beam shaping and inversion interferometry.
Rel. Carlo Ricciardi. Politecnico di Torino, Corso di laurea magistrale in Nanotechnologies For Icts (Nanotecnologie Per Le Ict), 2024
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Abstract
Microscopy is a fundamental tool in both research and industry, enabling the study of elements at the microscopic level. Light microscopy, in particular, utilizes light to resolve small structures. A significant challenge in the evolution of light microscopy has been the well-known phenomenon of the diffraction limit, limiting the achievable resolutions. However, advancements in technology have led to the development of new techniques that overcome this limitation, achieving resolutions at the order of tens of nanometers. In this thesis, we introduce a novel method with the aim of improving lateral resolution, applicable to techniques such as confocal microscopy and single molecule localization.
The work presented here lays the foundations of the method and demonstrates the feasibility of its experimental implementation, encouraging the continuation of its development
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