Due to their high performance and flexibility, FPGA are gaining popularity as a solution for space application. However, electronic system operating in space are subjected to interaction with ionizing radiation that is a source of malfunctions in the device. SRAM-based FPGA are particurarly sensitive to Single Event Effect that can lead to failure due to configuration memory corruption. To cope with this problem N-Modular Redundancy (NMR) is one of the mitigation approach commonly adopted. In this thesis, a new methodology for increasing reliability of circuit hardened by modular redundancy technique is proposed. The methodology statically analyze the implementation of a circuit implemented on the programmable hardware in order to identify single points of failure that can propagate faults to different replication-domain leading to application failure..