Fulvio Castello
Improving Apple Test Chips Efficacy through the Integration of SSN and ICL Automation Flows.
Rel. Stefano Quer, Paolo Bernardi. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Informatica (Computer Engineering), 2023
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Abstract
The increasing importance of the Design For Testing engineering approach within the silicon industry is exemplified by the need of validating the manufacturing process of electronic devices that have become more complex than ever before. The optimization of test time and efficiency for an ever-growing amount of dies has become the major focus of all tech corporations that strive to deliver higher quality products more frequently at a lower cost. The Apple Inc. team based in Munich is developing pre-production prototypes called "test chips" in order to organize all the output of their manufacturing processes into a flexible hardware arrangement meant for testability purposes.
Their building blocks are grouped into clusters, which are the basic functional units for all trials performed on silicon
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