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An On-Chip Testing Platform for Characterizing Multi-Sensor Time-Mode Compressed Sensing Systems

Cristian Mastronardi

An On-Chip Testing Platform for Characterizing Multi-Sensor Time-Mode Compressed Sensing Systems.

Rel. Gianluca Setti, Anton Serdijn Wouter, Omer Can Akgun, Fabio Pareschi. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Elettronica (Electronic Engineering), 2020

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Abstract:
Relators: Gianluca Setti, Anton Serdijn Wouter, Omer Can Akgun, Fabio Pareschi
Academic year: 2020/21
Publication type: Electronic
Number of Pages: 68
Subjects:
Corso di laurea: Corso di laurea magistrale in Ingegneria Elettronica (Electronic Engineering)
Classe di laurea: New organization > Master science > LM-29 - ELECTRONIC ENGINEERING
Ente in cotutela: TU Delft (PAESI BASSI)
Aziende collaboratrici: Technische Universiteit Delft
URI: http://webthesis.biblio.polito.it/id/eprint/16777
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