Berkay Turan
System Level Test of Reliable ICs.
Rel. Matteo Sonza Reorda, Paolo Bernardi, Marco Restifo. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Elettronica (Electronic Engineering), 2019
Abstract
In recent years, the increasing complexity of systems has led to new solutions for testing. According to Moore's Law, the number of transistors on a chip has grown up. Manufacturing costs are decreased with shrinking sizes. In spite of reducing manufacturer costs, the cost of the test remained the same. Hence, it occupies a considerable amount in the rate of total expenditure. Manufacturers cannot ignore testing despite the cost of the test since even the smallest errors can lead to significant safety issues. Testing is highly essential for the system's dependability, reliability and trustworthiness. Notably, in automotive systems, high dependability and safety are the key parameters.
The new generation of self-driving cars has brought a fresh perpective that full safety automotive systems
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