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Implementation and Evaluation of On-Chip Algorithms for Reliability Optimization of Embedded Flash Memories.
Rel. Paolo Bernardi, Riccardo Cantoro. Politecnico di Torino, Master of science program in Electronic Engineering, 2019
Abstract
Embedded Flash Wafer Sort Yield Modeling Simulating Alternative Redundancy and Feasibility Study for On-Site Suspect-identification/execution of Machine Learning
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