ADC noise measurement on FPGA board
Luca Fonticelli
ADC noise measurement on FPGA board.
Rel. Giovanni Antonio Costanzo. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Elettronica (Electronic Engineering), 2019
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Abstract
Improvements in electronic have allowed front-end part in communication systems to be faster and more precise: the focus on this part of a device is justified as the communication with the external world has to keep the rhythm with the high speed calculations of every CPU. Every application requires then a reliable and low noise-conditioned devices able to reach performances we use every day. New techniques are developing also in time - frequency metrology field, where the low noise rate is required to achieve high measurement accuracy. The use of new SoC commercial boards, composed by a programmable logic and processing system, is a matter of interest in this field in order to develop new measurement flows: this kind of applications are reliable in terms of flexibility, where on-the-fly test and re-programming hardware are required, and quite fast in processing data thanks to last years' CPU presence.
Implementing board-style techniques could allow researchers to avoid complex instruments tune and long measurement chain in favor of a deep versatility
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