Alice Drago
Comparative analysis of current measurement solutions for the definition of static parameters of semiconductor devices.
Rel. Vittorio Camarchia. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Elettronica (Electronic Engineering), 2019
Abstract
The project was born with the idea of realize a current meter able to substitute the one already present in a test machine produced by the company "Crea Collaudi Elettronici Automatizzati Srl". This machine allows the user to make leakage current test on semiconductors. So my aim was realize a more precise and with more scale current meter to improve the machine behaviour. For do this was required a double project, one with a differential stage like a first stage and the other one with instead a trans-resistance stage, for admit a comparison. The first part of my project was create offset and noise models for all the part of my circuit to make possible the evaluation of compliance with specifications.
In a second part of my design I have choose the better amplifier on the market, due to my aim, I have decide how to realize the two current meters and then I have make the design of all stages
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