System Level Test solutions for advanced automotive devices

Automotive systems must reach a high reliability in their electronic components. This kind of devices must undergo several tests and stress steps discovering all possible defects that could manifest during lifetime. Final Test (FT) based on structural tests like those generated by an ATPG is progressively less adequate for an efficient screening since it is prone to generate several false fails. To solve this problem, System Level Test (SLT) is increasingly adopted as one of the final steps in the testing process of complex Systems on Chip (SoCs) mimicking the operational conditions. This thesis aims at describing a first implementation of System Level Test realized to test automotive devices, possible cost reduction mixing SLT with other test phases and describe a possible configurable System Level Test equipment.