Delta encoding of failure bitmaps for efficient compaction and on-chip retention of diagnostic data collected on embedded RRAM memories
Bernard Borio
Delta encoding of failure bitmaps for efficient compaction and on-chip retention of diagnostic data collected on embedded RRAM memories.
Rel. Paolo Bernardi. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Informatica (Computer Engineering), 2024
Abstract
Embedded System-On-Chip memory capacity and reliability required by the Automotive industry is constantly growing. For this reason, manufacturing companies are moving to create faster and cheaper memories to supply the high demand for chips by Automotive companies. Since the correct working of these memories is crucial for such a delicate environment as the automotive, these memories must be deeply tested to be completely functional without any error. Infineon Technologies Inc. is developing an innovative technology for embedded memories called Resistive Random Access Memory – RRAM. This kind of memory is faster and cheaper than classical FLASH technology but is also subject to errors due to its chemical structure.
To ensure that the System-on-Chips (SoC) sold to the companies are free from these errors, these memories are thoroughly tested before reaching the market
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