Position information enhancing by beam shaping and inversion interferometry

Microscopy is a fundamental tool in both research and industry, enabling the study of elements at the microscopic level. Light microscopy, in particular, utilizes light to resolve small structures. A significant challenge in the evolution of light microscopy has been the well-known phenomenon of the diffraction limit, limiting the achievable resolutions. However, advancements in technology have led to the development of new techniques that overcome this limitation, achieving resolutions at the order of tens of nanometers. In this thesis, we introduce a novel method with the aim of improving lateral resolution, applicable to techniques such as confocal microscopy and single molecule localization. The work presented here lays the foundations of the method and demonstrates the feasibility of its experimental implementation, encouraging the continuation of its development. The method combines two concepts: beam shaping and inversion interferometry. We start with theoretical calculations on the attainable localization precision, followed by the evaluation and construction of five different interferometer configurations, ultimately identifying a stable one, which allows us to establish a proper measurement procedure and obtain the preliminary results. The analysis of the experimental results allows us to compare the implemented system with our initial calculations, revealing certain similarities. However, we are not yet able to conclude that the presented method can achieve the expected resolutions. Our work serves as a foundational step in a larger, ongoing project, where further research and refinement will be essential to gain deeper insights and fully realize its potential.