The thesis, "Computer Vision-Assisted Conductive Atomic Force Microscopy for 2D Materials" examines the integration of computer vision with Conductive Atomic Force Microscopy (C-AFM) to analyze 2D materials, particularly Transition Metal Dichalcogenides (TMDs), due to their significant importance in technology. The first part provides a comprehensive overview of 2D materials, discussing their properties, and applications in electronics, energy storage, biomedical fields, and photonics. An in-depth section is about the synthesis techniques such as mechanical exfoliation and chemical vapor deposition (CVD), which are crucial for producing 2D materials. The second part focuses on the principles, methodologies, and applications of Conductive Atomic Force Microscopy (C-AFM) in the study of 2D materials.