This thesis presents an innovative exploration of the initial debugging process for newly developed semiconductor silicon, focusing particularly on the 800G optical modules. Given the complex nature of semiconductor production, efficient strategies for first silicon bring-up and debugging are crucial to ensure the successful operation of these devices. This study delves into the intricacies of this process, primarily the challenges associated with Automatic Test Pattern Generation (ATPG) patterns and the use of Automatic Test Equipment (ATE) systems. It dives deep into the world of high-speed communication, focusing on the challenges of the first silicon debug in optical modules that operate at a whopping 800G.