The significant advancements in the microelectronics world in recent years have introduced unprecedented opportunities for the optimization of integrated circuits (ICs), allowing improvements in terms of performance, consumed power, and area; over time, this has also included an increasing complexity in any design, complicating test and verification processes that aim at demonstrating the correctness of the design. An ample range of functional and non-functional tests are nowadays performed by dedicated machines, known as automatic test equipments (ATEs), that are typically costly and, depending on the model, deeply oriented towards specific categories of ICs (e.g., purely analog or digital products); the advantages associated with the high degree of expertise in one field are also correlated, on the other hand, with the limitations that come when testing designs of different natures.