Comparative analysis of current measurement solutions for the definition of static parameters of semiconductor devices.

The project was born with the idea of realize a current meter able to substitute the one already present in a test machine produced by the company "Crea Collaudi Elettronici Automatizzati Srl". This machine allows the user to make leakage current test on semiconductors. So my aim was realize a more precise and with more scale current meter to improve the machine behaviour. For do this was required a double project, one with a differential stage like a first stage and the other one with instead a trans-resistance stage, for admit a comparison. The first part of my project was create offset and noise models for all the part of my circuit to make possible the evaluation of compliance with specifications. In a second part of my design I have choose the better amplifier on the market, due to my aim, I have decide how to realize the two current meters and then I have make the design of all stages. In a third part, starting from the stages and the models created I have done offset and noise calculation and settling time simulations to evaluate the fulfillment of specifications. Then, in a fourth design part, I have realize the schematic and PCBs with Altium Designers. And finally, the last part of my design consist in the mounting of all components on the PCBs, the test on the two circuit and the comparison between them with consequent selection of the final circuit.