Davide Pecchio
Electrical Characterization of Hex-SiGe Nanowires.
Rel. Matteo Cocuzza. Politecnico di Torino, Master of science program in Nanotechnologies For Icts, 2021
|
Preview |
PDF (Tesi_di_laurea)
- Thesis
Licence: Creative Commons Attribution Non-commercial No Derivatives. Download (62MB) | Preview |
Abstract
The semiconductor industry has required a significant increase in energy efficiency and computational performance of the electronic devices for decades. This results in the search for low-power, high-frequency devices. To meet these demands it was necessary to replace the electrical signals with photonic signals. One of the possible candidates are group III-V semiconductor materials, which can efficiently emit light, but they are not CMOS compatible, so their integration with Si chips is very expensive. Ge-rich SiGe alloys grown in the hexagonal crystal structure showed a direct bandgap nature. SiGe compounds are epitaxially grown in the hexagonal phase by MOVPE on thin hexagonal GaAs nanowires, that act as templates.
The result is a hex-GaAs core surrounded by a hex-SiGe shell in a GaAs/SiGe core/shell nanowire configuration
Relators
Publication type
URI
![]() |
Modify record (reserved for operators) |
