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Implementation and Evaluation of On-Chip Algorithms for Reliability Optimization of Embedded Flash Memories.
Rel. Paolo Bernardi, Riccardo Cantoro. Politecnico di Torino, Corso di laurea magistrale in Ingegneria Elettronica (Electronic Engineering), 2019
Abstract: |
Embedded Flash Wafer Sort Yield Modeling Simulating Alternative Redundancy and Feasibility Study for On-Site Suspect-identification/execution of Machine Learning |
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Relators: | Paolo Bernardi, Riccardo Cantoro |
Academic year: | 2019/20 |
Publication type: | Electronic |
Number of Pages: | 85 |
Additional Information: | Tesi secretata. Fulltext non presente |
Subjects: | |
Corso di laurea: | Corso di laurea magistrale in Ingegneria Elettronica (Electronic Engineering) |
Classe di laurea: | New organization > Master science > LM-29 - ELECTRONIC ENGINEERING |
Aziende collaboratrici: | Infineon Technologies AG |
URI: | http://webthesis.biblio.polito.it/id/eprint/12537 |
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