In the fast-paced landscape of the New Space Economy, companies are forced to accelerate time-to-market while keeping competitive pricing. This leads to an increasing demand for more efficient and flexible manufacturing processes, challenging traditional production methods. This thesis investigates an advanced approach to optimize the manufacturing testing procedures of Radiation Hardened by Design Field-Programmable Gate Arrays (FPGAs) embedded in System-on-Chip (SoC) devices, which can be adopted to support critical high-reliability aerospace missions and other demanding applications. The study aims to streamline traditional testing methods, which often prove complex and inflexible, by exploring the potential of using the onboard SoC processor for a light and adaptable test environment.