Semiconductor production is a highly optimized, accurate and standardized process with extremely high yields, however, it is not perfect. Defective or non-compliant devices need to be identified and isolated to avoid putting on the market non-working products. Testing of all the devices is performed by dedicated Automatic Test Equipment (ATE), which are specialized machines able to perform very fast measurements with high parallelism, being capable of measuring the parameters of many devices at the same time. These machines offer the hardware resources to perform the test, but this must be first written by a Test Engineer. Each product can bevastly different from the others, and every test program is often written from scratch to suit the specific device that needs to be tested.